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LA2816C MTU RFT for the Supply, Delivery, Installation and Commissioning of an Automated White Light Interferometry
One (1) white-light scanning interferometry-based 3D profilometer with sub nm resolution is required. The requirement is an automated white light interferometry system for the measurement of surface roughness and other associated features. The system should have a motorised focus and sample stage and automated control over the optical path with …
CPV: 38000000 Equipo de laboratorio, óptico y de precisión (excepto gafas), 38519650 Platinas de microscopio, 38519610 Oculares de microscopio, 38519100 Iluminadores para microscopios, 38516000 Microscopios ópticos compuestos monoculares o binoculares
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